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Evaluation of radiation hardness of the bipolar devices in the space conditions

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dc.contributor.authorRodin, A. S.
dc.contributor.authorBakerenkov, A. S.
dc.contributor.authorFelitsyn, V. A.
dc.contributor.authorPershenkov, V. S.
dc.contributor.authorTelets, V. A.
dc.contributor.authorРодин, Александр Сергеевич
dc.contributor.authorБакеренков, Александр Сергеевич
dc.contributor.authorТелец, Виталий Арсеньевич
dc.date.accessioned2024-11-25T15:02:58Z
dc.date.available2024-11-25T15:02:58Z
dc.date.issued2020
dc.description.abstract© Springer Nature Switzerland AG 2020.Real time dependence of operation temperature, which is typical for space environment, was taken into account in the numerical simulation of radiation degradation of LM111 bipolar voltage comparator input current. The technique and results of performed numerical analyses are presented and discussed.
dc.format.extentС. 807-810
dc.identifier.citationEvaluation of radiation hardness of the bipolar devices in the space conditions / Rodin, A.S. [et al.] // IFMBE Proceedings. - 2020. - 77. - P. 807-810. - 10.1007/978-3-030-31866-6_143
dc.identifier.doi10.1007/978-3-030-31866-6_143
dc.identifier.urihttps://www.doi.org/10.1007/978-3-030-31866-6_143
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85075621484&origin=resultslist
dc.identifier.urihttp://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS_CPL&DestLinkType=FullRecord&UT=WOS:000552314200143
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/20069
dc.relation.ispartofIFMBE Proceedings
dc.titleEvaluation of radiation hardness of the bipolar devices in the space conditions
dc.typeConference Paper
dspace.entity.typePublication
oaire.citation.volume77
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