Publication:
High-Performance, Reproducible Tip-Enhanced Raman Scattering Probes

dc.contributor.authorMochalov, K. E.
dc.contributor.authorSolovyova, D. O.
dc.contributor.authorEfimov, A. E.
dc.contributor.authorKlinov, D. V.
dc.contributor.authorOleinikov, V. A.
dc.contributor.authorОлейников, Владимир Александрович
dc.date.accessioned2024-11-27T15:35:49Z
dc.date.available2024-11-27T15:35:49Z
dc.date.issued2020
dc.description.abstractThe main limitation of the use of tip-enhanced Raman scattering (TERS) is due to the lack of reliable scanning probes. We present a simple procedure to manufacture TERS probes with highly reproducible characteristics that are reliable and provide sufficient enhancement. The procedure is based on the modification of conventional cantilevers of scanning probe microscopes by plasma etching, followed by the formation of a TERS enhancing region at the apex by deposition of colloidal nanoparticles by dielectrophoresis.
dc.format.extentС. 1084-1087
dc.identifier.citationHigh-Performance, Reproducible Tip-Enhanced Raman Scattering Probes / Mochalov, KE [et al.] // Technical Physics Letters. - 2020. - 46. - № 11. - P. 1084-1087. - 10.1134/S1063785020110103
dc.identifier.doi10.1134/S1063785020110103
dc.identifier.urihttps://www.doi.org/10.1134/S1063785020110103
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85106845974&origin=resultslist
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dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/22987
dc.relation.ispartofTechnical Physics Letters
dc.titleHigh-Performance, Reproducible Tip-Enhanced Raman Scattering Probes
dc.typeArticle
dspace.entity.typePublication
oaire.citation.issue11
oaire.citation.volume46
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