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Optical Diagnostics of Free Charge Carriers in Silicon Nanowire Arrays

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dc.contributor.authorRodichkina, S. P.
dc.contributor.authorNychyporuk, T.
dc.contributor.authorPavlikov, A. V.
dc.contributor.authorLysenko, V.
dc.contributor.authorTimoshenko, V. Y.
dc.contributor.authorТимошенко, Виктор Юрьевич
dc.date.accessioned2024-11-25T15:59:07Z
dc.date.available2024-11-25T15:59:07Z
dc.date.issued2020
dc.description.abstractThe impact of free charge carriers in arrays of silicon nanowires (SiNWs) of p- and n-type conductivities on their optical properties is probed by means of the infrared spectroscopy in attenuated total reflectance mode (IR-ATR) and Raman scattering. SiNWs are fabricated by metal-assisted chemical etching of low-doped p-type crystalline silicon (c-Si) wafers followed by thermodiffusional doping with p- and n-type impurities. The free charge carrier concentration in SiNWs is determined from their ATR spectra fitted using a model of the anisotropic effective medium with free charge carriers. The obtained data on the free charge carrier concentrations in the range of 10(19)-10(20) cm(-3) are compared with the corresponding values obtained from the Raman spectra, which are analyzed by considering the Fano effect in SiNWs, and the results of both methods are used to evaluate the electrical properties of SiNWs. The proposed optical methods to probe the electrical properties of SiNWs are discussed in view of possible applications in nanoelectronics and thermoelectric devices.
dc.identifier.citationOptical Diagnostics of Free Charge Carriers in Silicon Nanowire Arrays / Rodichkina, SP [et al.] // Physica Status Solidi (A) Applications and Materials Science. - 2020. - 10.1002/pssa.201900670
dc.identifier.doi10.1002/pssa.201900670
dc.identifier.urihttps://www.doi.org/10.1002/pssa.201900670
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85079797586&origin=resultslist
dc.identifier.urihttp://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS_CPL&DestLinkType=FullRecord&UT=WOS:000509617100001
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/20228
dc.relation.ispartofPhysica Status Solidi (A) Applications and Materials Science
dc.titleOptical Diagnostics of Free Charge Carriers in Silicon Nanowire Arrays
dc.typeArticle
dspace.entity.typePublication
relation.isAuthorOfPublication4cf6bcf1-0992-45ed-af93-68678d96a4da
relation.isAuthorOfPublication.latestForDiscovery4cf6bcf1-0992-45ed-af93-68678d96a4da
relation.isOrgUnitOfPublicationc8407a6f-7272-450d-8d99-032352c76b55
relation.isOrgUnitOfPublication.latestForDiscoveryc8407a6f-7272-450d-8d99-032352c76b55
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