Publication: Probabilistic Approach to Determining the Transient Upset Level of Digital Integrated Circuits
Дата
2022
Авторы
Marfin, V.
Moskalenko, K.
Karakozov, A.
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© 2022 IEEE.Transient upsets in complex digital circuits when exposed to pulsed laser radiation may not be reproduced from pulse to pulse, which is usually explained by the energy measurement error. To test this assumption, a new method is proposed, which consists in measuring the dependence of the upset probability on the pulse energy. We tested this approach on three microprocessor circuits. As a result of the experiment, it was found that in some cases (MCU2) the energy measurement error cannot fully explain the absence of an upset. We assume that an additional factor may be the state of the circuit and the phase of the clock signal at the moment of impact.
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Marfin, V. Probabilistic Approach to Determining the Transient Upset Level of Digital Integrated Circuits / Marfin, V., Moskalenko, K., Karakozov, A. // Moscow Workshop on Electronic and Networking Technologies, MWENT 2022 - Proceedings. - 2022. - 10.1109/MWENT55238.2022.9802237