Publication: Comparative analysis of silicon nanostructures by x-ray diffraction technique
| dc.contributor.author | Assilbayeva, R. B. | |
| dc.contributor.author | Kharin, A. Y. | |
| dc.contributor.author | Kargina, Y. V. | |
| dc.contributor.author | Timoshenko, V. Y. | |
| dc.contributor.author | Тимошенко, Виктор Юрьевич | |
| dc.date.accessioned | 2024-11-20T09:52:47Z | |
| dc.date.available | 2024-11-20T09:52:47Z | |
| dc.date.issued | 2019 | |
| dc.description.abstract | © Published under licence by IOP Publishing Ltd. Silicon nanoparticles and nanowires prepared by using different methods were investigated by means of x-ray diffraction (XRD) technique. Broadening of the XRD lines of crystalline Si lattice allows us to estimate the mean size of nanoparticles. Silicon nanoparticles stored in aqueous suspensions for several days were found to decrease their sizes due to dissolution process. The kinetics of dissolution for different kinds of nanoparticles were found to be different. It was also shown that the most unstable nanoparticles (microporous silicon ones) could be protected from dissolution via interaction with the polysaccharide molecules (dextrane) into the solution. | |
| dc.identifier.citation | Comparative analysis of silicon nanostructures by x-ray diffraction technique / Assilbayeva, R.B. [et al.] // IOP Conference Series: Materials Science and Engineering. - 2019. - 475. - № 1. - 10.1088/1757-899X/475/1/012010 | |
| dc.identifier.doi | 10.1088/1757-899X/475/1/012010 | |
| dc.identifier.uri | https://www.doi.org/10.1088/1757-899X/475/1/012010 | |
| dc.identifier.uri | https://www.scopus.com/record/display.uri?eid=2-s2.0-85062699584&origin=resultslist | |
| dc.identifier.uri | https://openrepository.mephi.ru/handle/123456789/16672 | |
| dc.relation.ispartof | IOP Conference Series: Materials Science and Engineering | |
| dc.title | Comparative analysis of silicon nanostructures by x-ray diffraction technique | |
| dc.type | Conference Paper | |
| dspace.entity.type | Publication | |
| oaire.citation.issue | 1 | |
| oaire.citation.volume | 475 | |
| relation.isAuthorOfPublication | 4cf6bcf1-0992-45ed-af93-68678d96a4da | |
| relation.isAuthorOfPublication.latestForDiscovery | 4cf6bcf1-0992-45ed-af93-68678d96a4da | |
| relation.isOrgUnitOfPublication | c8407a6f-7272-450d-8d99-032352c76b55 | |
| relation.isOrgUnitOfPublication.latestForDiscovery | c8407a6f-7272-450d-8d99-032352c76b55 |