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Cathode boards defects detection method for sTGC chambers

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dc.contributor.authorSmakhtin, V.
dc.contributor.authorTeterin, P.
dc.contributor.authorТетерин, Пётр Евгеньевич
dc.date.accessioned2024-11-27T07:56:23Z
dc.date.available2024-11-27T07:56:23Z
dc.date.issued2020
dc.description.abstract© 2020 IOP Publishing Ltd and Sissa Medialab.Harsh radiation conditions, including the ones expected for the operation with High-Luminosity LHC, require detailed and careful quality control of any gas detector from the very beginning stage of assembly. The existing probe methods for cathode boards QC are able to find shorts to ground, shorts between pads, and breaks in the readout line at the initial stage of manufacturing. The cosmic test requires fully assembled detectors and reveals pads with absent or low amplitude analog signals associated with resistance in the readout trace line. In the current work, we propose the direct method of such a defect recognition for both bare cathode boards and fully assembled detectors and demonstrate the examples of a successful cure.
dc.identifier.citationSmakhtin, V. Cathode boards defects detection method for sTGC chambers / Smakhtin, V., Teterin, P. // Journal of Instrumentation. - 2020. - 15. - № 8. - 10.1088/1748-0221/15/08/C08014
dc.identifier.doi10.1088/1748-0221/15/08/C08014
dc.identifier.urihttps://www.doi.org/10.1088/1748-0221/15/08/C08014
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85090915284&origin=resultslist
dc.identifier.urihttp://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS_CPL&DestLinkType=FullRecord&UT=WOS:000577269100002
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/22342
dc.relation.ispartofJournal of Instrumentation
dc.titleCathode boards defects detection method for sTGC chambers
dc.typeConference Paper
dspace.entity.typePublication
oaire.citation.issue8
oaire.citation.volume15
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