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Providing the Low Temperature of the Heat-Generating Power Devices during the Long-Term Experiment

dc.contributor.authorMuzafarov, M. V.
dc.contributor.authorKolosova, A. S.
dc.contributor.authorPechenkin, A. A.
dc.contributor.authorDavydov, G. G.
dc.contributor.authorGromova, P. S.
dc.contributor.authorBoychenko, D. V.
dc.contributor.authorМузафаров, Михаил Валентинович
dc.contributor.authorКолосова, Анна Сергеевна
dc.contributor.authorПеченкин, Александр Александрович
dc.contributor.authorДавыдов, Георгий Георгиевич
dc.contributor.authorБойченко, Дмитрий Владимирович
dc.date.accessioned2024-11-30T04:01:53Z
dc.date.available2024-11-30T04:01:53Z
dc.date.issued2021
dc.format.extentС. 289-292
dc.identifier.citationProviding the Low Temperature of the Heat-Generating Power Devices during the Long-Term Experiment / Muzafarov, M.V. [et al.] // Proceedings of the International Conference on Microelectronics, ICM. - 2021. - 2021-September. - P. 289-292. - 10.1109/MIEL52794.2021.9569044
dc.identifier.doi10.1109/MIEL52794.2021.9569044
dc.identifier.urihttps://www.doi.org/10.1109/MIEL52794.2021.9569044
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85118462445&origin=resultslist
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/25417
dc.relation.ispartofProceedings of the International Conference on Microelectronics, ICM
dc.titleProviding the Low Temperature of the Heat-Generating Power Devices during the Long-Term Experiment
dc.typeConference Paper
dspace.entity.typePublication
oaire.citation.volume2021-September
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