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Methods of catastrophic failure prevention during the SEL-sensitivity estimation of IC

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dc.contributor.authorTsirkov, A. N.
dc.contributor.authorЦирков, Артем Николаевич
dc.date.accessioned2024-12-25T16:05:13Z
dc.date.available2024-12-25T16:05:13Z
dc.date.issued2022
dc.description.abstract© 2022 IEEE.The suitability of electronics for space application greatly depends on ICs tolerance to single event effects, such as latchup (SEL), caused by heavy ions. Such events can lead to irreversible failures if specific prevention actions are not taken. This paper presents the results of a study of ICs functional (hard) failures prevention method. Important points are presented when configuring the protection scheme.This paper describes the use of a resistor in a power circuit and the developed system of a fast circuit breaker. The research was carried out on picosecond focused laser facility (PICO-4).
dc.identifier.citationTsirkov, A. N. Methods of catastrophic failure prevention during the SEL-sensitivity estimation of IC / Tsirkov, A.N. // Moscow Workshop on Electronic and Networking Technologies, MWENT 2022 - Proceedings. - 2022. - 10.1109/MWENT55238.2022.9802407
dc.identifier.doi10.1109/MWENT55238.2022.9802407
dc.identifier.urihttps://www.doi.org/10.1109/MWENT55238.2022.9802407
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85134001834&origin=resultslist
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/28140
dc.relation.ispartofMoscow Workshop on Electronic and Networking Technologies, MWENT 2022 - Proceedings
dc.titleMethods of catastrophic failure prevention during the SEL-sensitivity estimation of IC
dc.typeConference Paper
dspace.entity.typePublication
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