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The Use of Microelectronics Radiation Behavior as Physical Uncloned Function to Find Counterfeit

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dc.contributor.authorHovsepyan, H. A.
dc.contributor.authorKessarinskiy, L. N.
dc.contributor.authorShirin, A. O.
dc.contributor.authorКессаринский, Леонид Николаевич
dc.contributor.authorШирин, Алексей Олегович
dc.date.accessioned2024-11-26T12:49:51Z
dc.date.available2024-11-26T12:49:51Z
dc.date.issued2020
dc.description.abstract© 2020 IEEE.The article is devoted to the problem of counterfeiting electronic devices. The global trend is that the number of counterfeit microcircuits (and not only ICs) is increasing, but the effectiveness of detection methods is falling. Even using all known methods, the probability of identifying counterfeit is only a few percent. One of the methods to combat counterfeiting is to label authentic components. And the most secure label technique based on physical uncloned functions (PUF). So it is proposed to use the different features of radiation behavior degradation as PUF. A few examples of this use are presented in the article.
dc.identifier.citationHovsepyan, H. A. The Use of Microelectronics Radiation Behavior as Physical Uncloned Function to Find Counterfeit / Hovsepyan, H.A., Kessarinskiy, L.N., Shirin, A.O. // Moscow Workshop on Electronic and Networking Technologies, MWENT 2020 - Proceedings. - 2020. - 10.1109/MWENT47943.2020.9067496
dc.identifier.doi10.1109/MWENT47943.2020.9067496
dc.identifier.urihttps://www.doi.org/10.1109/MWENT47943.2020.9067496
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85083977334&origin=resultslist
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/21651
dc.relation.ispartofMoscow Workshop on Electronic and Networking Technologies, MWENT 2020 - Proceedings
dc.titleThe Use of Microelectronics Radiation Behavior as Physical Uncloned Function to Find Counterfeit
dc.typeConference Paper
dspace.entity.typePublication
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