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Measurement of Parameters of Analog-to-Digital Converters Based on the NI Hardware-Software Complex in the Course of a Radiation Experiment

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dc.contributor.authorTorshin, R. S.
dc.contributor.authorSorokoumov, G. S.
dc.contributor.authorBobrovsky, D. V.
dc.contributor.authorTitovets, D. O.
dc.contributor.authorKalashnikova, M. O.
dc.contributor.authorТоршин, Роман Сергеевич
dc.contributor.authorСорокоумов, Георгий Сергеевич
dc.contributor.authorБобровский, Дмитрий Владимирович
dc.contributor.authorТитовец, Дмитрий Олегович
dc.date.accessioned2024-11-29T16:24:42Z
dc.date.available2024-11-29T16:24:42Z
dc.date.issued2021
dc.description.abstract© 2021 IEEE.The paper presents an automated system for functional and parametric control of analog-to-digital converters (ADC) during a radiation experiment. The automated measuring system is based on the combined use of modular PXI equipment manufactured by National Instruments and the signal generator SMA100B manufactured by Rohde Schwarz (RS). The PXI-4461 module is the most significant module in the system. Hardware and software operations of the measuring system are discussed in the paper. The parameters controlled during total ionizing dose (TID) tests are listed in the paper alongside the algorithm for parametric control. We describe a histogram method for removing input noise. In order to mitigate drawbacks of histogram method, we measured sample median for each ADC code value during the experiment. With the help of this system, the main static and dynamic parameters of test ADCs are calculated and their degradation during irradiation at the Cs-137 isotope source is shown. Specifications for quantifying ADC dynamic performance were based on an FFT results analysis. Typical TID effects in ADCs are observed: degradation of the transfer function and associated deterioration of the accuracy parameters: integral nonlinearity, differential nonlinearity, offset and gain errors.
dc.identifier.citationMeasurement of Parameters of Analog-to-Digital Converters Based on the NI Hardware-Software Complex in the Course of a Radiation Experiment / Torshin, R.S. [et al.] // SIBCON 2021 - International Siberian Conference on Control and Communications. - 2021. - 10.1109/SIBCON50419.2021.9438886
dc.identifier.doi10.1109/SIBCON50419.2021.9438886
dc.identifier.urihttps://www.doi.org/10.1109/SIBCON50419.2021.9438886
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85107678349&origin=resultslist
dc.identifier.urihttp://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS_CPL&DestLinkType=FullRecord&UT=WOS:000680842100037
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/24204
dc.relation.ispartofSIBCON 2021 - International Siberian Conference on Control and Communications
dc.titleMeasurement of Parameters of Analog-to-Digital Converters Based on the NI Hardware-Software Complex in the Course of a Radiation Experiment
dc.typeConference Paper
dspace.entity.typePublication
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