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Total Ionizing Dose Effects in High-Speed 16-bit Analog-to-Digital Converter

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dc.contributor.authorTorshin, R.
dc.contributor.authorBobrovsky, D.
dc.contributor.authorUlanova, A.
dc.contributor.authorSorokoumov, G.
dc.contributor.authorKalashnikova, M.
dc.contributor.authorTitovets, D.
dc.contributor.authorТоршин, Роман Сергеевич
dc.contributor.authorБобровский, Дмитрий Владимирович
dc.contributor.authorУланова, Анастасия Владиславовна
dc.contributor.authorСорокоумов, Георгий Сергеевич
dc.contributor.authorТитовец, Дмитрий Олегович
dc.date.accessioned2024-12-25T15:55:19Z
dc.date.available2024-12-25T15:55:19Z
dc.date.issued2022
dc.description.abstract© 2022 IEEE.The paper presents the research results of Total Ionizing Dose (TID) Effects in high-speed (80 MSPS) analog-to-digital converter (ADC). The article incorporates the description of the equipment for parametric control of the device under test and methodology for measuring ADC characteristics. The article also presents pre-irradiation graphs of integral non-linearity (INL), differential non-linearity (DNL), amplitude spectrum and its degradation during exposure. With regard to findings of the study was determined the most critical operation mode of the Device Under Test (DUT) during irradiation and the most TID sensitive parameter.
dc.identifier.citationTotal Ionizing Dose Effects in High-Speed 16-bit Analog-to-Digital Converter / Torshin, R. [et al.] // Moscow Workshop on Electronic and Networking Technologies, MWENT 2022 - Proceedings. - 2022. - 10.1109/MWENT55238.2022.9802427
dc.identifier.doi10.1109/MWENT55238.2022.9802427
dc.identifier.urihttps://www.doi.org/10.1109/MWENT55238.2022.9802427
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85134054660&origin=resultslist
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/28124
dc.relation.ispartofMoscow Workshop on Electronic and Networking Technologies, MWENT 2022 - Proceedings
dc.titleTotal Ionizing Dose Effects in High-Speed 16-bit Analog-to-Digital Converter
dc.typeConference Paper
dspace.entity.typePublication
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