Publication: Digital Shearograph for Detecting Defect in Materials
dc.contributor.author | Azamatov, Z. T. | |
dc.contributor.author | Gaponov, V. E. | |
dc.contributor.author | Jeenbekov, A. A. | |
dc.contributor.author | Bakhromov, A. B. | |
dc.date.accessioned | 2024-12-27T15:18:40Z | |
dc.date.available | 2024-12-27T15:18:40Z | |
dc.date.issued | 2023 | |
dc.format.extent | С. S263-S266 | |
dc.identifier.citation | Digital Shearograph for Detecting Defect in Materials / Azamatov, Z. T. [et al.] // Russian Microelectronics. - 2023. - 52. - № Suppl 1. - P. S263-S266. - 10.1134/S106373972360019X | |
dc.identifier.doi | 10.1134/S106373972360019X | |
dc.identifier.uri | https://www.doi.org/10.1134/S106373972360019X | |
dc.identifier.uri | https://www.scopus.com/record/display.uri?eid=2-s2.0-85188542869&origin=resultslist | |
dc.identifier.uri | https://openrepository.mephi.ru/handle/123456789/29780 | |
dc.relation.ispartof | Russian Microelectronics | |
dc.title | Digital Shearograph for Detecting Defect in Materials | |
dc.type | Article | |
dspace.entity.type | Publication | |
oaire.citation.issue | Suppl 1 | |
oaire.citation.volume | 52 |