Персона: Борисюк, Петр Викторович
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Руководитель научной группы "Квантовая гравиметрия на основе стандартов времени и частоты"
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Application of keV-energy proton scattering for thin film analysis
© 2018 Elsevier B.V. Hydrogen ions are not widely used in low or medium-energy ion scattering spectroscopy. However, in certain cases, the use of non-destructive hydrogen ions with low nuclear stopping may provide additional information compared with noble gas ions. In this work, we describe in situ analysis of nanometer layer deposition of Au on Si and vice versa using keV-energy proton scattering spectroscopy. Ion beam sputtering and thermal evaporation were used for deposition of surface layers. The maximum thickness of deposited layers was measured with X-ray photoelectron spectroscopy and surface profiler. The accuracy of in situ surface layer thickness determination with energy spectra of scattered protons is discussed.
Excitation of the low-energy Th-229m isomer Th in the electron bridge process via the continuum
The paper studies the excitation of the Th-229 nucleus to the anomalously low-lying isomeric state 3/2(+)(8.28 +/- 0.17 eV) in the electron bridge process via the continuum of the electron spectrum. Resonant excitation of the nucleus was found to be always possible in the scheme, no matter where the electron levels of an atom or ion were located. Formulas for the excitation cross section by narrow and wide laser lines are obtained. In the resonance, where the process under consideration turns into laser photoionization followed by nuclear excitation in electron capture, the cross section of the process was shown to be comparable in magnitude with that of the photoionization of the thorium atom. Experimental schemes for testing the effect were proposed, which would allow measuring the frequency of the nuclear isomeric transition 3/2(+) -> 5/2(+) to a high precision, which is the first-priority (and still unresolved) task for creating a nuclear clock.