2020, Mavritskii, O. B., Egorov, A. N., Pechenkin, A. A., Savchenkov, D. V., Boychenko, D. V., Маврицкий, Олег Борисович, Егоров, Андрей Николаевич, Печенкин, Александр Александрович, Бойченко, Дмитрий Владимирович

© COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.Singe event effect (SEE) simulation in modern integrated circuits (ICs) by femtosecond laser irradiation through the substrate allows eliminating a lot of problems connected to the presence of multiple opaque metal layers above the IC active layer. With this irradiation geometry, the proper wavelength of laser radiation should be chosen to generate sufficient amount of nonequilibrium charge in the active layer on the one hand, and to avoid significant laser energy losses in the thick substrate on the other hand. In this paper several typical microelectronic ICs were selected to investigate the dependence of SEE generation effectiveness on the laser wavelength when irradiating through the substrate of various thickness. It was found, that the most appropriate laser wavelength for the silicon substrate thicknesses of 300 to 800 μm lies in the 1030 to 1070 nm range.

2022, Egorov, A. N., Mavritskii, O. B., Pechenkin, A. A., Savchenkov, D. V., Kholina, M. S., Егоров, Андрей Николаевич, Маврицкий, Олег Борисович, Печенкин, Александр Александрович, Холина, Марта Сергеевна

© 2022 SPIE.The application of two-photon absorption (TPA) for local nonequilibrium charge generation in the semiconductor microelectronic structures improves the 3D-spatial resolution of optical testing techniques (such as OBIC and similar), as compared to those, based on single-photon absorption (SPA). In this paper we discuss the results of laser single-event effect (SEE) simulation in digital potentiometer AD8400, using the TPA of tightly focused femtosecond laser radiation. The experiments were performed at the setup, which includes the tunable optical parametric amplifier with output wavelength in 900…1200 nm region. The results were compared to those obtained by SPA technique on the same experimental setup.

2019, Chumakov, A. I., Bobrovsky, D. V., Pechenkin, A. A., Savchenkov, D. V., Sorokoumov, G. S., Shvetsov-Shilovskiy, I. I., Чумаков, Александр Иннокентьевич, Бобровский, Дмитрий Владимирович, Печенкин, Александр Александрович, Сорокоумов, Георгий Сергеевич, Швецов-Шиловский, Иван Иванович

© 2019, Pleiades Publishing, Ltd.Abstract: The results of research on nonstationary latchup effects (LEs) under the influence of heavy charged particles and ionizing radiation pulses, which are spontaneously counteracted depending on the operating conditions, are presented. This behavior is caused by the effects of the rail span collapse inside the complementary metal-oxide-system (CMOS) of very large scale integrated (VLSI) circuits. The experimental studies are carried out on both the ion accelerator and the laser facilities.

2022, Egorov, A. N., Mavritskii, O. B., Pechenkin, A. A., Savchenkov, D. V., Kholina, M. S., Егоров, Андрей Николаевич, Маврицкий, Олег Борисович, Печенкин, Александр Александрович, Холина, Марта Сергеевна

© 2022 IEEE.The results of laser single-event effect (SEE) simulation in digital potentiometer AD8400, using the two-photon absorption (TPA) of tightly focused femtosecond 1200 nm laser radiation are presented. Comparative measurements obtained by the single-photon absorption (SPA) of picosecond 1064 nm laser radiation in the same device revealed the improved 3D-spatial resolution of TPA compared to SPA-based pulsed laser testing. The effective depth of single event latchup (SEL) sensitive layer estimation was calculated from experimental results.

2021, Tsirkov, A. N., Savchenkov, D. V., Novikov, A. A., Pechenkin, A. A., Цирков, Артем Николаевич, Печенкин, Александр Александрович

© 2021 IEEE.a division of labor plays significant role in the efficiency of laser SEE Testing. The highest efficiency can be achieved when testers fulfill their roles in a global task: one is engaged in debugging and monitoring the testing progress at the facility, another one participates in the preparation and performance monitoring of the device under test (DUT). This article describes the architecture of our software for SEE testing that consists of two parts: the one responsible for the functional testing of the DUT and another one responsible for the SEE testing logic. Separating these two parts allows them to be developed independently by different specialists. The DUT part of software controls a wide variety of equipment including National Instruments PXI/PXIe modules which are commonly used for functional testing of the devices under test. The laser SEE testing part of software controls all parts of the laser facility (laser beam positioning and pulse synchronization, visualization of exposure area, etc.) and the acquisition of laser SEE testing data. One of the main points of this paper is the idea of communication between the apps on different platforms (Microsoft.NET and NI LabVIEW) over local area network.