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Simulation of annealing and the ELDRS in p-MNOS RadFETs

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dc.contributor.authorMaslovsky, V. M.
dc.contributor.authorMrozovskaya, E. V.
dc.contributor.authorZimin, P. A.
dc.contributor.authorChubunov, P. A.
dc.contributor.authorZebrev, G. I.
dc.contributor.authorМрозовская, Елизавета Владимировна
dc.contributor.authorЧубунов, Павел Александрович
dc.contributor.authorЗебрев, Геннадий Иванович
dc.date.accessioned2024-11-21T18:37:21Z
dc.date.available2024-11-21T18:37:21Z
dc.date.issued2019
dc.description.abstract© 2019 by Begell House, Inc.The manifestation of simultaneous annealing in p-MNOS (metal–nitride–oxide‑semiconductor) samples with thick oxide and a pronounced effect of enhanced low-dose-rate sensitivity (ELDRS) are investigated. The simulation was based on experimental data.
dc.format.extentС. 313-318
dc.identifier.citationSimulation of annealing and the ELDRS in p-MNOS RadFETs / Maslovsky, V.M. [et al.] // High Temperature Material Processes. - 2019. - 23. - № 4. - P. 313-318. - 10.1615/HighTempMatProc.2019031964
dc.identifier.doi10.1615/HighTempMatProc.2019031964
dc.identifier.urihttps://www.doi.org/10.1615/HighTempMatProc.2019031964
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85085615234&origin=resultslist
dc.identifier.urihttp://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS_CPL&DestLinkType=FullRecord&UT=WOS:000557723000003
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/19541
dc.relation.ispartofHigh Temperature Material Processes
dc.titleSimulation of annealing and the ELDRS in p-MNOS RadFETs
dc.typeArticle
dspace.entity.typePublication
oaire.citation.issue4
oaire.citation.volume23
relation.isAuthorOfPublicationa8412981-4b8c-4a86-90fc-af6455c61ddf
relation.isAuthorOfPublication17cb37ba-7e66-4ec0-b5f4-85e833303ac2
relation.isAuthorOfPublication480f2f5c-4a04-4b0c-9e47-55e54fc07c4f
relation.isAuthorOfPublication.latestForDiscoverya8412981-4b8c-4a86-90fc-af6455c61ddf
relation.isOrgUnitOfPublication06e1796d-4f55-4057-8d7e-bb2f3b5676f5
relation.isOrgUnitOfPublication.latestForDiscovery06e1796d-4f55-4057-8d7e-bb2f3b5676f5
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