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Precision Masa Control Based Authentication Methods of Electronic Components to Counterfeit Detection

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dc.contributor.authorShirin, A. O.
dc.contributor.authorTaiibov, F. F.
dc.contributor.authorKameneva, A. S.
dc.contributor.authorKessarinskiy, L. N.
dc.contributor.authorKoval, K. A.
dc.contributor.authorBoychenko, D. V.
dc.contributor.authorКессаринский, Леонид Николаевич
dc.contributor.authorКоваль, Кирилл Александрович
dc.contributor.authorБойченко, Дмитрий Владимирович
dc.date.accessioned2024-11-29T22:36:52Z
dc.date.available2024-11-29T22:36:52Z
dc.date.issued2021
dc.description.abstract© 2021 IEEE.The article is devoted to the problem of identifying counterfeit electronic components. The article presents the results of complex test methods such as weighing and X-ray structural analysis. It is shown that the same counterfeit defects can be detected in different ways. But the best performance and reliability of the results are provided by a set of methods.
dc.format.extentС. 123-125
dc.identifier.citationPrecision Masa Control Based Authentication Methods of Electronic Components to Counterfeit Detection / Shirin, A.O. [et al.] // Proceedings of the International Conference on Microelectronics, ICM. - 2021. - 2021-September. - P. 123-125. - 10.1109/MIEL52794.2021.9569037
dc.identifier.doi10.1109/MIEL52794.2021.9569037
dc.identifier.urihttps://www.doi.org/10.1109/MIEL52794.2021.9569037
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85118437827&origin=resultslist
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/24916
dc.relation.ispartofProceedings of the International Conference on Microelectronics, ICM
dc.titlePrecision Masa Control Based Authentication Methods of Electronic Components to Counterfeit Detection
dc.typeConference Paper
dspace.entity.typePublication
oaire.citation.volume2021-September
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