Publication:
Thermal transport across nanoscale damage profile in sapphire irradiated by swift heavy ions

Простая страница элемента
dc.contributor.authorAbdullaev, A.
dc.contributor.authorChauhan, V. S.
dc.contributor.authorMuminov, B.
dc.contributor.authorO'Connell, J.
dc.contributor.authorSkuratov, V. A.
dc.contributor.authorСкуратов, Владимир Алексеевич
dc.date.accessioned2024-11-25T16:41:44Z
dc.date.available2024-11-25T16:41:44Z
dc.date.issued2020
dc.description.abstractWe studied the degradation of thermal conductivity in single crystal sapphire (alpha-Al2O3) irradiated by 167 MeV Xe swift heavy ions (SHIs) over the multiple fluences in the range of 10(12)-10(14) ions/cm(2). Thermal conductivity was measured primarily in the cross-plane direction using a noncontact ultrafast optical pump-probe technique called picosecond time domain thermoreflectance (TDTR). Multiple samples with variable ion fluences allowed us to probe distinct regions resulting from different regimes of microstructure evolution caused by electronic energy loss. By tuning the penetration depth of the thermal waves using different modulation frequencies, two regions with distinct conductivities were identified and the values of which were found to be consistent with phonon-mediated thermal transport models while the microstructure was confirmed by electron microscopy characterization. These damaged regions were determined to be a several micrometer thick ion track region and several tens of nanometer-thick amorphous layer present only above 5.0 x 10(13) ions/cm(2). These results demonstrate the applicability of TDTR to resolve thermal transport behavior in SHI irradiated oxides having nonhomogeneous damage profile on a nanometer scale. The presented approach facilitates future studies aiming at resolving the impact of distinct damage resulting from electronic and nuclear stopping regimes under irradiation. Published under license by AIP Publishing.
dc.identifier.citationThermal transport across nanoscale damage profile in sapphire irradiated by swift heavy ions / Abdullaev, A [et al.] // Journal of Applied Physics. - 2020. - 127. - № 3. - 10.1063/1.5126413
dc.identifier.doi10.1063/1.5126413
dc.identifier.urihttps://www.doi.org/10.1063/1.5126413
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85077809590&origin=resultslist
dc.identifier.urihttp://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS_CPL&DestLinkType=FullRecord&UT=WOS:000515689000033
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/20346
dc.relation.ispartofJournal of Applied Physics
dc.titleThermal transport across nanoscale damage profile in sapphire irradiated by swift heavy ions
dc.typeArticle
dspace.entity.typePublication
oaire.citation.issue3
oaire.citation.volume127
relation.isAuthorOfPublicationa42d0cba-a1ca-4481-b526-7b326b53db08
relation.isAuthorOfPublication.latestForDiscoverya42d0cba-a1ca-4481-b526-7b326b53db08
relation.isOrgUnitOfPublicationba0b4738-e6bd-4285-bda5-16ab2240dbd1
relation.isOrgUnitOfPublication.latestForDiscoveryba0b4738-e6bd-4285-bda5-16ab2240dbd1
Файлы
Original bundle
Теперь показываю 1 - 1 из 1
Уменьшенное изображение
Name:
W3002044345.pdf
Size:
2.19 MB
Format:
Adobe Portable Document Format
Description:
Download
Коллекции
Публикации