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Application of Transmission Electron Microscopy for the Study of a Functional Nanoelement

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dc.contributor.authorPrikhodko, K. E.
dc.contributor.authorDement’eva, M. M.
dc.contributor.authorПриходько, Кирилл Евгеньевич
dc.date.accessioned2024-12-04T14:24:09Z
dc.date.available2024-12-04T14:24:09Z
dc.date.issued2024
dc.format.extentС. 2093-2097
dc.identifier.citationPrikhodko, K. E. Application of Transmission Electron Microscopy for the Study of a Functional Nanoelement / Prikhodko, K.E., Dement’eva, M.M. // Technical Physics. - 2024. - 69. - № 7. - P. 2093-2097. - 10.1134/S1063784224070363
dc.identifier.doi10.1134/S1063784224070363
dc.identifier.urihttps://www.doi.org/10.1134/S1063784224070363
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85205540992&origin=resultslist
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/26352
dc.relation.ispartofTechnical Physics
dc.titleApplication of Transmission Electron Microscopy for the Study of a Functional Nanoelement
dc.typeArticle
dspace.entity.typePublication
oaire.citation.issue7
oaire.citation.volume69
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relation.isAuthorOfPublication.latestForDiscovery162432cf-0190-45b0-93f6-e38eae07a362
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