Publication:
Simulation of XFEL induced fluorescence spectra of hollow ions and studies of dense plasma effects

Дата
2020
Авторы
Deschaud, B.
Peyrusse, O.
Rosmej, F. B.
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Научные группы
Организационные подразделения
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Организационная единица
Институт лазерных и плазменных технологий
Стратегическая цель Института ЛаПлаз – стать ведущей научной школой и ядром развития инноваций по лазерным, плазменным, радиационным и ускорительным технологиям, с уникальными образовательными программами, востребованными на российском и мировом рынке образовательных услуг.
Выпуск журнала
Аннотация
X-ray free electron laser (XFEL) interaction with solids has been simulated to resolve simultaneously variable XFEL photon energy and x-ray spectral distribution of the target emission (2D-maps). It is discovered that the highly transient charge state distribution exhibits a characteristic target response due to the action of the sharply rising radiation field. Finally, we identify advantageous features for studies of dense plasma effects of two K-shell vacancy hollow ion x-ray emission excited via resonance excitation. These features and characteristics permit the global study of dense plasma effects via the simulation of the time-integrated joint distribution of pumped and fluorescence energies. It is shown that the simulation of these specific 2D-maps offers a global vision of the complex interplay between different processes or phenomena such as photoionization, resonance excitation, or ionization potential depression.
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Цитирование
Simulation of XFEL induced fluorescence spectra of hollow ions and studies of dense plasma effects / Deschaud, B, Peyrusse, O, Rosmej, FB // Physics of Plasmas. - 2020. - 27. - № 6. - 10.1063/5.0011193
URI
https://www.doi.org/10.1063/5.0011193
 https://www.scopus.com/record/display.uri?eid=2-s2.0-85092406660&origin=resultslist
 http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS_CPL&DestLinkType=FullRecord&UT=WOS:000542597100001
 https://openrepository.mephi.ru/handle/123456789/22000
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