Персона: Скуратов, Владимир Алексеевич
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ВРЕМЯ-РАЗРЕШЕННАЯ ФОТОЛЮМИНЕСЦЕНЦИЯ Al2O3, ОБЛУЧЕННОГО ТЯЖЕЛЫМИ ИОНАМИ С ЭНЕРГИЕЙ 1.2 – 3 МэВ/АЕМ
2021, Маматова, М., Скуратов, В. А., Олейничак, А., Даулетбекова, А. К., Гиниятова, Ш. Г., Скуратов, Владимир Алексеевич
Time Correlated Single Photon Counting technique has been used to study the luminescence decay in Al2O3 irradiated with swift heavy ions. As was found, picosecond laser pulse excitation at 445 nm enhances broad overlapped emission bands ranging from 490 to 750 nm with lifetimes gradually increasing from 7 ns (500 nm) to τ = 9 ns (640 nm). The nature of this luminescence is associated with radiative recombination of F2 2+-centers and F2 2+-centers + Cr impurity.
АМОРФИЗАЦИЯ И МЕХАНИЧЕСКИЕ НАПРЯЖЕНИЯ В Si3N4 ПРИ ОБЛУЧЕНИИ БЫСТРЫМИ ТЯЖЕЛЫМИ ИОНАМИ
2021, Мутали, А. К., Скуратов, В. А., Ибраева, А. Д., Жумажанова, А. Т., Даулетбекова, А., Акылбеков, А., Здоровец, М. В., Скуратов, Владимир Алексеевич
The Raman spectroscopy method was used to study the radiation damage and associated internal mechanical stresses in polycrystalline silicon nitride (Si3N4) irradiated with swift heavy 167 MeV Xe and 710 MeV Bi ions. The cross-section and near surface spectra of the irradiated region were registered at room temperature. FWHM parameters - 204 cm−1 and peak position - 862 cm−1 were used to characterize the amorphization and the mechanical stress level.
ИССЛЕДОВАНИЕ ПОВРЕЖДЕНИЙ В МОНОКРИСТАЛЛАХ Y3Fe5O12, ОБЛУЧЕННЫХ БЫСТРЫМИ ТЯЖЕЛЫМИ ИОНАМИ, МЕТОДОМ РАМАНОВСКОЙ СПЕКТРОСКОПИИ
2019, Мутали, А. К., Сайфулин, М. М., Скуратов, В. А., Янсе ван Вуурен, А., О’Коннелл, Ж. Г., Скуратов, Владимир Алексеевич
The Raman spectroscopy method was used to study the radiation damage formed along the path of swift heavy ions in a yttrium iron garnet (Y3Fe5O12, YIG). YIG single crystals have been irradiated with swift Xe and Bi ions with energies of 167 and 715 MeV, respectively. Irradiation was carried out at room temperature in the range of fluences from 1011 to 1013 ions /cm2. The results obtained in this work is compared with previously obtained direct data (transmission electron microscopy) and indirect methods (Rutherford backscattering spectroscopy, X-ray diffraction).