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Пришвицын, Александр Сергеевич

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Институт лазерных и плазменных технологий
Стратегическая цель Института ЛаПлаз – стать ведущей научной школой и ядром развития инноваций по лазерным, плазменным, радиационным и ускорительным технологиям, с уникальными образовательными программами, востребованными на российском и мировом рынке образовательных услуг.
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Пришвицын
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Александр Сергеевич
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20192
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Автор: Krat, S. × End date: 2019 ×

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    The dependence of lithium emissivity from temperature in vacuum ЗАВИСИМОСТЬ СТЕПЕНИ ЧЕРНОТЫ ЛИТИЯ ОТ ТЕМПЕРАТУРЫ В ВАКУУМЕ
    (2019) Prishvitsyn, A. S.; Krat, S.; Harina, A. P.; Pisarev, A. A.; Пришвицын, Александр Сергеевич; Крат, Степан Андреевич; Писарев, Александр Александрович
    © 2019 National Research Center Kurchatov Institute. All rights reserved.Correct interpretation of IR video observation data of the surfaces of plasma-facing elements in fusion devices requires detailed knowledge about the emissivity factor of these surfaces in different conditions. In this work, results of emissivity measurements for free metallic lithium surface and a lithium surface supported by the capillary-porous system (CPS) are measured as a function of temperature in the range from 400 to 800 K. Emissivity of solid lithium changed from ~0.04 at 400 K to ~0.09 at 453 K. During melting a sudden drop of emissivity down to ~0.04 was observed. Emissivity increased linearly from 0.04 to ~0.15 with temperature increasing from 455 to 800 K. For fully wetted CPS, emissivity was close to that of free lithium surface for temperature up to ~570 K, while at higher temperature it was lower, probably due to changes in microrelief at high temperatures.
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    Elastic backscattering as a method for the measurement of the integral lithium content in thin films on fusion-relevant substrates
    (2019) Mayer, M.; Krat, S.; Vasina, Y.; Prishvitsyn, A.; Gasparyan, Y.; Pisarev, A.; Крат, Степан Андреевич; Пришвицын, Александр Сергеевич; Гаспарян, Юрий Микаэлович; Писарев, Александр Александрович
    © 2019 Elsevier B.V.Different ion beam analysis techniques for the study of thin lithium-containing layers on top of fusion relevant materials are discussed and compared to each other. Elastic backscattering analysis (EBS) with protons is determined to be one of the most promising techniques and allows measurements of Li layers with thicknesses from ∼100 nm up to ∼600 μm, as shown by SIMNRA simulations. The best sensitivity for thin films (∼100 nm) can be achieved using 4 MeV protons with 170° scattering detection angle for layers on Mo and W substrates, and 2 MeV for C substrates. Experimentally EBS measurements were successfully tested for Li films with thicknesses from ∼50 nm up to ∼400 nm after air exposure. The Li films become strongly inhomogeneous and require averaging over multiple measurements in nearby areas. This necessitates averaging over multiple nearby measurement points, and limits the overall precision of the measurement.